Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...
Leverage Functional Interfaces For High-Speed Test Access During All Phases Of The Silicon Lifecycle
Chip testing used to be straightforward. The development team used fault simulation to select a subset of the functional tests that could detect most possible manufacturing faults. These were ...
HANGZHOU, ZHEJIANG, CHINA, January 19, 2026 /EINPresswire.com/ -- In recent years, the manufacturing industry has seen ...
Expertise from Forbes Councils members, operated under license. Opinions expressed are those of the author. So, what does this mean for the organizations that develop these products? It means that ...
As designs move to smaller nanometer processes, test development is becoming more difficult, effectively impeding product release. Not only are test sets growing at a very high rate, but they are ...
Despite the proliferation of electrical test and inspection techniques, functional test remains necessary to ensure that a product will work in its final environment. In fact, functional test is often ...
As electronic products move from prototyping to mass production, manufacturers must rely on efficient, scalable, and ...
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