At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...

For more than 40 years, ICT (in-circuit test) has been instrumental in identifying process defects on countless varieties of populated PCB (printed-circuit board) assemblies. An in-circuit tester ...

Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...

The Chinese manufacturer said it developed a new circuit-model–based method to accurately detect hot-spot risks in TOPCon back-contact modules, overcoming limitations of the IEC 61215 approach caused ...