STAr Technologies, a leading manufacturer of semiconductor test probe cards, unveiled the new 3D/2.5D MEMS micro-cantilever probe card for WAT reliability testing. The Virgo-Prima Series probe card is ...
This is the fourth in our series, Think Outside the Chip….MEMS-Based Systems Solutions. In previous articles, I and my fellow authors have addressed the basic concept of MEMS-based system solutions, ...
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