For advanced technologies, the industry is seeing very complicated silicon defect types and defect distribution. One consequence is that scan chain diagnosis becomes more difficult. To improve the ...

In the modern era, where meeting high performance and low power targets for any complex SoC (System on Chip) is very tough, testing the SoC has become even more challenging. The purpose of several DFT ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

Scan insertion to improve test coverage and reduce test pattern volume is very common in today’s DFT tools. All of the major ATPG tool vendors (Synopsys, Cadence, and Mentor) offer this approach in ...

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...