EDN

The history and future of scan design

For more than four decades, scan technology has somehow eluded the radar screen of the IC test industry. As test continues to evolve and make significant newsworthy changes, scan has maintained a ...
EDN

Take scan test out of the critical path

Integrated circuit complexity and integration continuously advances, posing challenges to the development process. Market profitability, however, demands that products be designed and produced as fast ...
Electronic Design

Expanded Role for JTAG DFT

In recent years, boundary scan has transformed itself. JTAG started more than a decade ago as a simple structural interconnect test technology. It now is a foundational embedded infrastructure capable ...
Electronic Design

Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their ...
Machine Design

Laser Scan Adjustment Eliminates Defects in 3D-Printed Metal Parts

Designing the right scan path, and laser intensity along that path, is key to turning out quality metal parts using laser powder-bed fusion. The most popular 3D printing process for making metal parts ...