Keithley Instruments (Germering, Germany) has released a free tutorial CD on reliability testing for semiconductor test engineers. The CD entitled “Understanding Measurements: Essential Reliability ...

Aehr Test Systems (NASDAQ:AEHR) used a recent presentation to outline its position in semiconductor reliability testing, with ...

According to reports, seven kinds of Korean chips will be launched into orbit aboard a 6U-class microsatellite, where they ...

AUSTIN, Texas--(BUSINESS WIRE)-- NI (NASDAQ: NATI) today announced the acquisition of SET GmbH (“SET”), long-standing experts in aerospace and defense test system development and recent innovators in ...

Congratulations to alumnus Bryan Root (ElEngr’84), who was recently elevated to Institute of Electrical and Electronics Engineers Fellow for leadership in improving semiconductor reliability test ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

STAr Technologies, a leading supplier of semiconductor reliability test systems, announced the shipment of the all-in-one SMU-per-pin test system, the STAr Pluto-hiVIP, to benchmark the semiconductor ...

Semiconductor aging refers to the slow loss of electrical characteristics of the semiconductor device as a result of continuous use or prolonged exposure to various environmental conditions like ...

Every day, new methods are being developed to harvest, cleanse, integrate, and analyze data sources and extract from them useful, actionable intelligence to aid decision-making and other processes.

As defined by Moore’s Law, the semiconductor field has been growing at a steady pace since the 1960s. Concurrent with this progression, semiconductors are becoming more complex, densely integrated, ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

Keithley Instruments has announced the S510, a high-channel-count, turnkey semiconductor reliability test system for use in lifetime modeling of advanced ULSI CMOS processes at the 65-nm node and ...