The fluidic force microscope (FluidFM) can be considered as the nanofluidic extension of the atomic force microscope (AFM). This novel instrument facilitates the experimental procedure and data ...
Atomic Force Microscopy (AFM) was first described in 1986 by Binnig et al. 1, where it was used to investigate the topography of hard surfaces. In the following years, many related techniques such as ...
To investigate experimentally the extension of a spring and how it is related to the applied force, and recall that the extension of a spring is directly proportional to the force applied, provided ...