Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
Researchers have discovered a novel way to manipulate defects in semiconductors. The study holds promising opportunities for novel forms of precision sensing, or the transfer of quantum information ...
The small and complicated features of TSVs give rise to different defect types. Defects can form during any of the TSV ...
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