The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

The Mann-Whitney U Test, also known as the Wilcoxon Rank Sum Test, is a non-parametric statistical test used to compare two samples or groups. The Mann-Whitney U Test assesses whether two sampled ...

Journal of the Royal Statistical Society. Series C (Applied Statistics), Vol. 62, No. 5 (NOVEMBER 2013), pp. 723-740 (18 pages) We explore a particular fully parametric approach to quantile regression ...

The BMJ is an international peer reviewed medical journal and a fully "online first" publication. Our publishing model–"continuous publication"– means that all articles appear on bmj.com before being ...

What is the Friedman test? The Friedman test, also sometimes referred to as Friedman’s two-way analysis of variance by ranks, is a non-parametric statistical test used to investigate whether groups of ...

This short course will provide an overview of non-parametric statistical techniques. The course will first describe what non-parametric statistics are, when they should be used, and their advantages ...