Optimize SEM analysis with Broad Ion Beam Milling, a cutting-edge technique for preparing intricate specimens, ensuring high-quality imaging and evaluation.

When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

The proteins that make up our cells hold within an entire world of information, which, when unlocked, can give us insights into the origins of many essential biological phenomena. This information is ...

In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...